000 00245nam a2200097Ia 4500
008 170619s9999 xx 000 0 und d
100 _aAbramovici- Miron
245 0 _aDigital Systems Testing and Testable Design
260 _bJaico Pub.
260 _c2010
546 _aENGLISH
999 _c20111
_d20111